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Mechatronics

Vision Based Force Sensing for Nanomanipulation

A vision-based algorithm for estimating tip interaction forces on a deflected Atomic Force Microscope (AFM) cantilever is described. Specifically, we propose that the algorithm can estimate forces acting on an Atomic Force Microscope (AFM) cantilever being used as a nanomanipulator inside a Scanning Electron Microscope (SEM). The vision based force sensor can provide force feedback in real-time, a feature absent in many SEMs. A methodology based on cantilever slope detection is used to estimate the forces acting on the cantilever tip.

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Mechatronics and Haptic Interfaces Lab at Rice University

Mechanical Engineering Department, MS 656, 713-348-2300
Bioscience Research Collaborative 980, Houston, TX 77030